Browse "School of Electrical Engineering(전기및전자공학부)" by Type Conference

Showing results 15841 to 15860 of 22768

15841
Relative scale estimation between two camera motions

Jeong, Y.; Kweon, In-So, 2008 19th International Conference on Pattern Recognition, ICPR 2008, 2008-12-08

15842
Relaxed Adiabatic Evolution of Fundamental HE11 Mode on Etched Optical Fiber Tapers

Son, Gyeongho; Choi, Jiwon; Han, Dae Seok; Jeong, Youngjae; Yu, Kyoungsik, IEEE Photonics Conference (IPC), IEEE, 2020-09

15843
Relay cooperation with guard zone for distributed underlaid networks

Cho, Sungrae; Choi, Wan, IEEE Global Commun. Conf. (Globecom), IEEE, 2011-12-06

15844
Relay networks with orthogonal components

Nam, W.; Chung, Sae-Young, 46th Annual Allerton Conference on Communication, Control, and Computing, pp.738 - 745, 2008-09-24

15845
Relevant modulation schemes combined with coding proposed for indoor wireless infrared communication systems

Dzung, H.-Q.; Dong, S.; Lee, Man Seop, Proceedings of the International Conference on Telecommunications 2002, v.2, pp.425 - 429, 2002-06-23

15846
Reliability analysis of real-time controllers with dual-modular temporal redundancy

Kim, Byung Kook, RTCSA '99, pp.364 - 371, IEEE, 1999-12

15847
Reliability and Performance Analysis of Satellite On-board Time-Space-Time Switching Networks with Multiple Separated Space Switches

Sung, Dan Keun; Kang, SH, Joint Conference on Communications, Networks, Switching Systems and Satellite Communications, pp.232 - 236, 1993

15848
Reliability and Performance Analysis of Time-Space-Time Swiching Networks with Multiple Separated Space Switches

Sung, Dan Keun; Kang, SH, International Teletraffic Congress, pp.111 - 116, 1991

15849
Reliability and Security in the CoDeeN Content Distribution Network

Park, KyoungSoo, USENIX Annual Technical Conference (USENIX ATC), USENIX, 2004-06-29

15850
Reliability Improvement of Charge Trap Flash Memory Cell with Sealing Oxide in Fluorine Incorporation

이승환; 이태윤; 안현준; 이태인; 신의중; 신성원; 조병진, 제26회 한국반도체학술대회, DB하이텍, 한국반도체산업협회, 한국반도체연구조합, 2019-02-14

15851
Reliability improvements of SS7 signaling protocol architecture using ATM technology

Lee, SungWon; Song, Young-Jae; Cho, Dong-Ho, IEEE International Conference on Communications, ICC 1998, pp.1415 - 1419, IEEE, 1998-06

15852
Reliability issues in multi-gate FinFETs

Choi, Yang-Kyu; Han, J.-W.; Lee, H., ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, pp.1101 - 1104, 2006-10-23

15853
Reliability of Barrier Ribs in a Flexible Photoluminescent Display

Choi, Kyung Cheol; Jang, C; Kim, SH; Kim, KJ; Ahn, SI, Material Research Society, 2009-11-30

15854
Reliability of BCB Passivated InAlAs/InGaAs HEMTs Under Thermal Stress

Kim, D; Yoon, M; Kim, T; Yang, Kyounghoon, IEEE, International Symposium on Compound Semiconductors, pp.231 - 232, IEEE, 2003

15855
Reliability of high dielectric Ba0.5Sr0.5TiO3 ferroelectrics

Lee, Hee Chul, pp.0 - 0, 1999-02-01

15856
Reliability Study of CMOS FinFETs

Choi, Yang-Kyu; Ha, Daewon; Snow, Eric; Bokor, Jeffrey; King, Tsu-Jae, IEEE, pp.177 - 180, IEEE, 2003-12

15857
Reliable Data Generation using Stereo Camera for a Mobile Robot

Ha, Jong Hyo; Chung, Myung Jin, The 43rd KIEE Summer Annual Conference, KIEE, 2012-07

15858
Reliable and Long-Lasting Solution-Processed Organic Light-Emitting Diodes with Flexible Multilayer Encapsulation

Kim, Hyuncheol; Kwon, Seonil; Jeon, Yongmin; Choi, Seungyeop; Kwon, Jeong Hyun; Choi, Kyung Cheol, IMID 2017, IMID, 2017-08

15859
Reliable artificial leaky integrate and fire (LIF) neuron device using 2D material

Ahn, Wonbae; Ham, Ayoung; Oh, Jungyeop; Kang, Kibum; Choi, Sung-Yool, The 12th International Workshop on 2D Materials (A3 Workshop), Nanjing university, 2023-07-20

15860
Reliable control via additive redundant adaptive controller

Kim, Byung Kook; Cho, YC; Bien, Z, 1989 American Control Conference, 1989-06

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