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Reliability Study of CMOS FinFETs

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Choi, Yang-Kyuresearcher / Ha, Daewon / Snow, Eric / Bokor, Jeffrey / King, Tsu-Jae
Publisher
IEEE
Issue Date
2003-12
Language
ENG
Citation

IEEE, pp.177 - 180

URI
http://hdl.handle.net/10203/694
Appears in Collection
EE-Conference Papers(학술회의논문)
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Reliability%20Study%20of%20CMOS%20FinFETs.pdf(338.43 kB)Download

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