Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 30941 to 30960 of 51084

30941
Probe Card Design with Signal and Power Integrity for Wafer-level Application Processor Test in LPDDR Channel

Kim, Joungho; Song, Jinwook; Lee, Eunjung; Kim, Jonghoon; Park, Shinyoung; Park, Jeoung Keun; Park, Jong Hyun; et al, 66th Electronic Components and Technology Conference (ECTC), 66th Electronic Components and Technology Conference (ECTC), 2016-05-31

30942
Probe head and card structures for high-speed wafer level testing of application processor (AP) with LPDDR interface = 엘피디디알 인터페이스를 갖는 어플리케이션 프로세서를 웨이퍼 레벨에서 고속으로 테스트하기 위한 프로브 헤드와 카드 구조link

Lee, Eunjung; 이은정; et al, 한국과학기술원, 2015

30943
Probe integrated with organic light source and manufacturing method thereof

Choi, Kyung Cheol; Lee, Hyunjoo Jenny; Kim, MiKyung; Lee, Somin

30944
Probe-based admission control (PBAC) algorithm for MPLS multicast network

Choi, JunKyun, OECC/COIN, pp.432 - 433, 2004-07

30945
Probenet: Probing Deep Networks

Lee, Jae-Hyeok; Kim, Seong Tae; Ro, Yong Man, 26th IEEE International Conference on Image Processing, ICIP 2019, pp.3821 - 3825, IEEE Signal Processing Society, 2019-09-25

30946
Probing temperature-dependent interlayer coupling in a MoS2/h-BN heterostructure

Park, Hamin; Shin, Gwang Hyuk; Lee, Khang June; Choi, Sung-Yool, Nano Research, v.13, no.2, pp.576 - 582, 2020-02

30947
Probing the Critical Thickness and Role of TiO2 Overlayer on SnO2 in Improving the Electrochemical Performance of Lithium-ion Batteries

Cheong, Jun Young; Mweta, Jaksoni; Chang, Joon Ha; Kim, Chanhoon; Lee, Jung Yong; Kim, Il Doo, The Korean Ceramic Society Spring Meeting, 한국세라믹 학회, 2016-04-20

30948
Probing-based estimation of end-to-end available bandwidth

Nam, SY; Kim, S; Kim, J; Sung, Dan Keun, IEEE COMMUNICATIONS LETTERS, v.8, no.6, pp.400 - 402, 2004-06

30949
Probius: Automated approach for VNF and service chain analysis in software-defined NFV

NAM, JAEHYUN; Seo, Junsik; Shin, Seungwon, 2018 Symposium on SDN Research, SOSR 2018, pp.1 - 13, Association for Computing Machinery, Inc, 2018-03-29

30950
The Problem of Stability in the Application of Neural Network to Continuous-Time Dynamic Systems

Eom, Tae-Dok; Hong, S.G.; Park, K.B.; Lee, Ju-Jang, Intelligent Robots and Systems 95. 'Human Robot Interaction and Cooperative Robots', Proceedings. 1995 IEEE/RSJ International Conference on, Volume: 3, On page(s): 326-331, 1995

30951
Problems in Inverse Scattering - Illposedness, Resolution, Local Minima, and Uniqueness

Ra, Jung Woong, Inverse Problems and Related Topics(The secon joint seminar between Japan and Korea), 2001

30952
Problems in Inverse Scattering - Illposedness, Resolution, Local Minima, and Uniqueness

Ra, Jung Woong, Kyushu University Invited Workshop, 2000

30953
Procedural Memory Learning from Demonstration for Task Performance

Yoo, Yong Ho; Kim, Jong Hwan, IEEE International Conference on Systems, Man, and Cybernetics, IEEE Systems, Man, and Cybernetics Society, 2015-10-11

30954
PROCEDURAL METADATA: STRUCTURED GUIDE FOR DATA INTEROPERABILITY IN SUPPORT OF WEB OF THINGS

Kim, Nakyoung; Oh, Hyeontaek; Choi, Jun Kyun, ITU Journal: ICT Discoveries, v.1, no.2, 2018-11

30955
Process and material properties of HfLaO(x) prepared by atomic layer deposition

He, Wei; Chan, Daniel S. H.; Kim, Sun-Jung; Kim, Young-Sun; Kim, Sung-Tae; Cho, Byung Jin, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.10, pp.G189 - G193, 2008-08

30956
Process and Structural Optimization of a Planar-Type Thermoelectric Power Generator by Screen-Printing Technique

We, Ju Hyung; Kim, Sun Jin; Kim, Gyung Soo; Cho, Byung Jin, The 31st International & 10th European Conference on Thermoelectrics, Int'l Thermoelectrics Society, 2012-07-09

30957
Process Control and Uniformity Improvement in Synthesis of Large-scale Graphene Layers on Metal Thin Films.

Cho, Byung Jin, 2010 Material Research Society Spring Meeting, 2010 Material Research Society Spring Meeting, 2010-04-09

30958
Process dependence of MOSFET performance and reliability with N2O-based furnace-growth gate oxides

Yoon, Giwan, Electrochemical Society Meeting Proceeding, pp.495 - 503, Electrochemical Society Meeting Proceeding, 1995-04

30959
Process engineering of the surface passivation using $(NH_4)_2S$ for the InP MOS capacitor with ALD $Al_2O_3$ = $Al_2O_3$를 사용한 InP MOS capacitor에서의 $(NH_4)_2S$를 이용한 기판 표면 패시베이션의 실험적 최적화에 대한 연구link

Hong, Hee-Jeong; 홍희정; et al, 한국과학기술원, 2014

30960
Process insensitive phase-locked loop = 공정 변화에 민감하지 않은 Phase-locked looplink

Lee, Mi-Young; 이미영; et al, 한국과학기술원, 2003

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