Process dependence of MOSFET performance and reliability with N2O-based furnace-growth gate oxides
- Issue Date
- 1995-04
- Language
- ENG
- Citation
Electrochemical Society Meeting Proceeding, pp.495 - 503
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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