Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 37401 to 37420 of 51618
| Throughput Scaling of Covert Communication Over Wireless Adhoc Networks Cho, Kang-Hee; Lee, Si-Hyeon; Tan, Vincent Y. F., IEEE TRANSACTIONS ON INFORMATION THEORY, v.66, no.12, pp.7684 - 7701, 2020-12 |
| Throughput, Energy Consumption, and Energy Efficiency of IEEE 802.15.6 Body Area Network (BAN) MAC Protocol Jung, BH; Usman, A; Sung, Dan Keun, IEEE PIMRC 2012, IEEE, 2012-09 |
| Throughput-delay and stability analysis of an asynchronous spread spectrum packet radio network Lim, Dong-Min; Lee, Hwang Soo, INFOCOM'91, v.3, pp.11401 - 11410, INFOCOM, 1991-04-07 |
| THROUGHPUT-DELAY AND STABILITY ANALYSIS OF AN ASYNCHRONOUS SPREAD SPECTRUM PACKET RADIO NETWORK LIM, DM; Lee, Hwang Soo, IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, v.41, no.4, pp.469 - 478, 1992-11 |
| Throughput-effective on-chip networks for manycore accelerators Bakhoda A.; Kim, John Dongjun; Aamodt T.M., 43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010, v.0, no.0, pp.421 - 432, IEEE Computer Society, 2010-12-04 |
| ThumbAir: In-Air Typing for Head Mounted Displays Gil, Hyunjae; Oakley, Ian, PROCEEDINGS OF THE ACM ON INTERACTIVE MOBILE WEARABLE AND UBIQUITOUS TECHNOLOGIES-IMWUT, v.6, no.4, 2022-12 |
| THz CMOS signal generator and ASK transmitter = THz CMOS 신호 발생기와 ASK 송신기link Koo, Hyunji; 구현지; et al, 한국과학기술원, 2015 |
| THz Detector with an Antenna Coupled Stacked CMOS Plasma-Wave FET Chai, Seung Wan; Lim, Sungmook; Hong, Song-Cheol, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.24, no.12, pp.869 - 871, 2014-12 |
| THz IC 응용을 위한 높은 수율과 균일도를 지니는 Dry-etched RTD의 개발 = Development of Dry-etched RTDs with high yield and uniformity for THz IC applicationslink 임재진; 양경훈; et al, 한국과학기술원, 2018 |
| THz Imaging용 가변 용량 쇼트키 접합 다이오드를 사용한 RTD기반 주파수 변조 발진기 개발 = Development of RTD-based frequency tunable oscillators by using InP-based schottky barrier varactor diodes for THz imaging applicationslink 하동호; 양경훈; et al, 한국과학기술원, 2018 |
| THz 통신 시스템에 대한 비트오류율(Bit error rate) 측정 강광용; 백문철; 하재권; 강진섭; 양경훈, 한국전자파학회 하계종합학술대회, pp.1 - 1, 한국전자파학회, 2019-08-23 |
| THzID: A 1.6mm2 Package-Less Cryptographic Identification Tag with Backscattering and Beam-Steering at 260GHz Ibrahim, Mohamed I.; Khan, Muhammad Ibrahim Wasiq; Juvekar, Chiraag S.; Jung, Wanyeong; Yazicigil, Rabia Tugce; Chandrakasan, Anantha P.; Han, Ruonan, IEEE International Solid-State Circuits Conference, ISSCC 2020, pp.454 - 455, Institute of Electrical and Electronics Engineers (IEEE), 2020-02-19 |
| Ti Thickness Effects in Pt/Ti Bottom Electrode on Properties of (Ba, Sr)TiO3 Thin Film Lee, Hee Chul, pp.0 - 0, 1996-03-01 |
| Ti thickness effects in Pt/Ti bottom electrode on properties of (Ba,Sr)TiO3 thin film Cha, SY; Lee, SH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.16, no.1-4, pp.183 - 190, 1997 |
| Ti 박막 확산을 이용한 $LiNbO_3$의 주기적 분극반전 = Periodic domain inversion of $LiNbO_3$ using Ti film diffusionlink 이병탁; Lee, Byeong-Tak; et al, 한국과학기술원, 1994 |
| TiBroco: A fast and secure distributed learning framework for tiered wireless edge networks Han, Dong-Jun; Sohn, Jy-yong; Moon, Jaekyun, 40th IEEE Conference on Computer Communications, INFOCOM 2021, Institute of Electrical and Electronics Engineers Inc., 2021-05 |
| TID and SEE hardened n-MOSFET layout on a bulk silicon substrate which combines a DGA n-MOSFET and a guard drain Roh, Young Tak; Lee, Hee Chul, 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015, Institute of Electrical and Electronics Engineers Inc., 2015-11-02 |
| TID Effect on 12-bit 100kSPS SAR ADC Designed with DGA n-MOSFET Kim, Tae Hyo; Lee, Hee Chul, ISOCC (International SoC Design Conference) 2015, ISOCC, 2015-11-03 |
| TID effect on a 12-bit 100kSPS SAR ADC designed with a dummy gate-assisted n-MOSFET Kim, Tae Hyo; Lee, Hee Chul, IEEE NSS/MIC/RTSD, IEEE, 2015-11-03 |
| TID Effect Test of the ICS307GI-03LF Serially Programmable Clock Source for Space Applications Shin, Goo-Hwan; Ryu, Kwang-Sun; Myung, Noh-Hoon; Kim, Ee-Eul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.59, pp.670 - 673, 2011-08 |
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