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Paramagnetic structural defects and conductivity in hydrogenated nanocrystalline carbon-doped silicon films Shevaleevskii, OI; Tsvetkov, AA; Larina, LL; Myong, SY; Lim, Koeng Su, SEMICONDUCTORS, v.38, no.5, pp.528 - 530, 2004 |
Spectroscopic ellipsometry analysis for investigation of the modification of thin film p-a-Si1-xCx : H after ultraviolet treatment in an Argon ambient Myong, SY; Kim, SS; Lim, Koeng Su, THIN SOLID FILMS, v.455, pp.482 - 485, 2004-05 |
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