DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jang, Jun Tae | ko |
dc.contributor.author | Park, Jozeph | ko |
dc.contributor.author | Ahn, Byung Du | ko |
dc.contributor.author | Kim, Dong Myong | ko |
dc.contributor.author | Choi, Sung-Jin | ko |
dc.contributor.author | Kim, Hyun-Suk | ko |
dc.contributor.author | Kim, Dae Hwan | ko |
dc.date.accessioned | 2015-04-29T01:29:58Z | - |
dc.date.available | 2015-04-29T01:29:58Z | - |
dc.date.created | 2015-04-27 | - |
dc.date.created | 2015-04-27 | - |
dc.date.issued | 2015-03 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, v.106, no.12 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10203/198321 | - |
dc.description.abstract | The effect of direct current sputtering power of indium-gallium-zinc-oxide (IGZO) on the performance and stability of the corresponding thin-film transistor devices was studied. The field effect mobility increases as the IGZO sputter power increases, at the expense of device reliability under negative bias illumination stress (NBIS). Device simulation based on the extracted sub-gap density of states indicates that the field effect mobility is improved as a result of the number of acceptor-like states decreasing. The degradation by NBIS is suggested to be induced by the formation of peroxides in IGZO rather than charge trapping. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | INSTABILITY | - |
dc.subject | EXTRACTION | - |
dc.title | Effect of direct current sputtering power on the behavior of amorphous indium-gallium-zinc-oxide thin-film transistors under negative bias illumination stress: A combination of experimental analyses and device simulation | - |
dc.type | Article | - |
dc.identifier.wosid | 000351876700051 | - |
dc.type.rims | ART | - |
dc.citation.volume | 106 | - |
dc.citation.issue | 12 | - |
dc.citation.publicationname | APPLIED PHYSICS LETTERS | - |
dc.identifier.doi | 10.1063/1.4916550 | - |
dc.contributor.localauthor | Park, Jozeph | - |
dc.contributor.nonIdAuthor | Jang, Jun Tae | - |
dc.contributor.nonIdAuthor | Ahn, Byung Du | - |
dc.contributor.nonIdAuthor | Kim, Dong Myong | - |
dc.contributor.nonIdAuthor | Choi, Sung-Jin | - |
dc.contributor.nonIdAuthor | Kim, Hyun-Suk | - |
dc.contributor.nonIdAuthor | Kim, Dae Hwan | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | INSTABILITY | - |
dc.subject.keywordPlus | EXTRACTION | - |
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