Interfacial microstructure and joint strength of Sn-3.5Ag-X (X = Cu, In, Ni) solder joint

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dc.contributor.authorChoi, WKko
dc.contributor.authorKim, JHko
dc.contributor.authorJeong, SWko
dc.contributor.authorLee, HyuckMoko
dc.date.accessioned2007-11-16T07:32:59Z-
dc.date.available2007-11-16T07:32:59Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2002-01-
dc.identifier.citationJOURNAL OF MATERIALS RESEARCH, v.17, no.1, pp.43 - 51-
dc.identifier.issn0884-2914-
dc.identifier.urihttp://hdl.handle.net/10203/1973-
dc.description.abstractInterfacial phase and microstructure, solder hardness. and joint strength of Sn-3.5Ag-X (X = Cu. In, Ni; compositions are all in wt% unless specified otherwise) solder alloys were investigated. Considering the melting behavior and the mechanical properties, five compositions of Sn-3.5Ag-X solder alloys were selected. To examine the joint characteristics, they were soldered on under bump metallurgy isothermally at 250 degreesC for 60 s. Aging and thermal cycling (T/C) were also performed on the solder joint. The interfacial microstructure of the joint was observed by scanning electron microscopy. X-ray diffraction and energy dispersive x-ray analyses were made to identify the type of solder phase and to measure compositions. Excessive growth of an inter-facial intermetallic layer in the Sn-3.5Ag-6.5 In solder joint led to a brittle fracture. In the other four solder joints, ductile fractures occurred through the solder region and the solder hardness was closely related with the joint strength.-
dc.description.sponsorshipThis study has been supported by the Center for Electronic Packaging Materials (CEPM) of the Korea Science and Engineering Foundation (KOSEF).en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherMATERIALS RESEARCH SOCIETY-
dc.subjectTHERMODYNAMIC ASSESSMENT-
dc.subjectMECHANICAL-PROPERTIES-
dc.subjectSN SYSTEM-
dc.subjectLEAD-FREE-
dc.subjectALLOYS-
dc.subjectBI-
dc.subjectSUBSTRATE-
dc.subjectEVOLUTION-
dc.subjectFATIGUE-
dc.subjectGROWTH-
dc.titleInterfacial microstructure and joint strength of Sn-3.5Ag-X (X = Cu, In, Ni) solder joint-
dc.typeArticle-
dc.identifier.wosid000173190800009-
dc.identifier.scopusid2-s2.0-0036259086-
dc.type.rimsART-
dc.citation.volume17-
dc.citation.issue1-
dc.citation.beginningpage43-
dc.citation.endingpage51-
dc.citation.publicationnameJOURNAL OF MATERIALS RESEARCH-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorLee, HyuckMo-
dc.contributor.nonIdAuthorChoi, WK-
dc.contributor.nonIdAuthorKim, JH-
dc.contributor.nonIdAuthorJeong, SW-
dc.type.journalArticleArticle-
dc.subject.keywordPlusTHERMODYNAMIC ASSESSMENT-
dc.subject.keywordPlusMECHANICAL-PROPERTIES-
dc.subject.keywordPlusSN SYSTEM-
dc.subject.keywordPlusLEAD-FREE-
dc.subject.keywordPlusALLOYS-
dc.subject.keywordPlusBI-
dc.subject.keywordPlusSUBSTRATE-
dc.subject.keywordPlusEVOLUTION-
dc.subject.keywordPlusFATIGUE-
dc.subject.keywordPlusGROWTH-
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