Heat-treatment to suppress the formation of Kirkendall voids in Sn-3.5Ag/Cu solder joints

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dc.contributor.authorKim, Sung-Hwanko
dc.contributor.authorYu, Jinko
dc.date.accessioned2015-03-26T08:47:51Z-
dc.date.available2015-03-26T08:47:51Z-
dc.date.created2013-09-30-
dc.date.created2013-09-30-
dc.date.issued2013-09-
dc.identifier.citationMATERIALS LETTERS, v.106, pp.75 - 78-
dc.identifier.issn0167-577X-
dc.identifier.urihttp://hdl.handle.net/10203/194201-
dc.description.abstractSn-3.5Ag solder reacted with heat-treated Cu films, and the characteristics of Kirkendall void formation at the Cu3Sn/Cu interface were investigated. Heat-treatment for the suppression of Kirkendall void formation in Sn-3.5Ag/Cu solder joints was conducted at varying temperature (T=400, 500 and 600 degrees C). The results showed that S segregation on the void surfaces were effectively suppressed by heat-treatment, and Kirkendall voiding at the Cu3Sn/Cu interface decreased as the heat-treatment temperature was increased. According to the solid solubility limit of sulfur in Cu, S in Cu film was in solid solution at all heat-treatment temperatures, so the amount of sulfur segregation was reduced. (C) 2013 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectCOPPER ELECTRODEPOSITION-
dc.subjectELECTROPLATED COPPER-
dc.subjectROOM-TEMPERATURE-
dc.subjectGLYCOL-
dc.subjectFILMS-
dc.subjectCU-
dc.titleHeat-treatment to suppress the formation of Kirkendall voids in Sn-3.5Ag/Cu solder joints-
dc.typeArticle-
dc.identifier.wosid000322682500021-
dc.identifier.scopusid2-s2.0-84878343075-
dc.type.rimsART-
dc.citation.volume106-
dc.citation.beginningpage75-
dc.citation.endingpage78-
dc.citation.publicationnameMATERIALS LETTERS-
dc.identifier.doi10.1016/j.matlet.2013.05.019-
dc.contributor.localauthorYu, Jin-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorElectrodeposition-
dc.subject.keywordAuthorMetallurgy-
dc.subject.keywordAuthorMicrostructure-
dc.subject.keywordAuthorRecrystallization-
dc.subject.keywordAuthorSegregation-
dc.subject.keywordAuthorSpectroscopy-
dc.subject.keywordPlusCOPPER ELECTRODEPOSITION-
dc.subject.keywordPlusELECTROPLATED COPPER-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusGLYCOL-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusCU-
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