Correlation between soft annealing conditions and structural, microstructural, morphological, and optical properties of CuInS2 thin films prepared by sulfurization of stacked precursor

Abstract

CulnS(2) (CIS) thin films were prepared by sulfurization of In/Cu stacked precursor films. Prior to sulfurization the stacked metallic precursors were subjected to the soft annealing in Ar atmosphere at different time (10, 30, and 60 min) and temperature (100 degrees C and 300 degrees C). The effect of soft annealing condition on the structural, morphological and optical properties of CIS films was investigated. X-ray diffraction, Raman, and X-ray photoelectron spectroscopy studies showed that the sulfurized thin films exhibited a CIS tetragonal structure with minor secondary phases such as Cu2-xS and Culn(5)S(8). The secondary phases were minimized by introducing soft annealed process in the CIS thin films. Void free CIS microstructures have been observed for soft annealed CIS films. The band gap energy of CIS films were increased horn 1.37 to 1.5 eV depending on the soft annealing conditions.