Work function engineering of single layer graphene by irradiation-induced defects

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We report the tuning of electrical properties of single layer graphene by a-beam irradiation. As the defect density increases upon irradiation, the surface potential of the graphene changes, as determined by Kelvin probe force microscopy and Raman spectroscopy studies. X-ray photoelectron spectroscopy studies indicate that the formation of C/O bonding is promoted as the dose of irradiation increases when at atmospheric conditions. Our results show that the surface potential of the graphene can be engineered by introducing atomic-scale defects via irradiation with high-energy particles. (C) 2013 AIP Publishing LLC.
Publisher
AMER INST PHYSICS
Issue Date
2013-10
Language
English
Article Type
Article
Keywords

MONOLAYER GRAPHENE; RAMAN-SPECTROSCOPY; FORCE MICROSCOPY; EXCITATION; FRICTION; STATES; FILMS; OXIDE

Citation

APPLIED PHYSICS LETTERS, v.103, no.17

ISSN
0003-6951
DOI
10.1063/1.4826642
URI
http://hdl.handle.net/10203/191116
Appears in Collection
EEW-Journal Papers(저널논문)
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