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Work function engineering of single layer graphene by irradiation-induced defects

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dc.contributor.authorKim, Jong-Hunko
dc.contributor.authorHwang, Jin Heuiko
dc.contributor.authorSuh, Joonkiko
dc.contributor.authorTongay, Sefaattinko
dc.contributor.authorKwon, Sangkuko
dc.contributor.authorHwang, C. C.ko
dc.contributor.authorWu, Junqiaoko
dc.contributor.authorPark, JeongYoungko
dc.date.accessioned2014-11-25T05:33:32Z-
dc.date.available2014-11-25T05:33:32Z-
dc.date.created2013-12-12-
dc.date.created2013-12-12-
dc.date.issued2013-10-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.103, no.17-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/191116-
dc.description.abstractWe report the tuning of electrical properties of single layer graphene by a-beam irradiation. As the defect density increases upon irradiation, the surface potential of the graphene changes, as determined by Kelvin probe force microscopy and Raman spectroscopy studies. X-ray photoelectron spectroscopy studies indicate that the formation of C/O bonding is promoted as the dose of irradiation increases when at atmospheric conditions. Our results show that the surface potential of the graphene can be engineered by introducing atomic-scale defects via irradiation with high-energy particles. (C) 2013 AIP Publishing LLC.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectMONOLAYER GRAPHENE-
dc.subjectRAMAN-SPECTROSCOPY-
dc.subjectFORCE MICROSCOPY-
dc.subjectEXCITATION-
dc.subjectFRICTION-
dc.subjectSTATES-
dc.subjectFILMS-
dc.subjectOXIDE-
dc.titleWork function engineering of single layer graphene by irradiation-induced defects-
dc.typeArticle-
dc.identifier.wosid000326455100017-
dc.identifier.scopusid2-s2.0-84887042213-
dc.type.rimsART-
dc.citation.volume103-
dc.citation.issue17-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.identifier.doi10.1063/1.4826642-
dc.contributor.localauthorPark, JeongYoung-
dc.contributor.nonIdAuthorKim, Jong-Hun-
dc.contributor.nonIdAuthorHwang, Jin Heui-
dc.contributor.nonIdAuthorSuh, Joonki-
dc.contributor.nonIdAuthorTongay, Sefaattin-
dc.contributor.nonIdAuthorKwon, Sangku-
dc.contributor.nonIdAuthorHwang, C. C.-
dc.contributor.nonIdAuthorWu, Junqiao-
dc.type.journalArticleArticle-
dc.subject.keywordPlusMONOLAYER GRAPHENE-
dc.subject.keywordPlusRAMAN-SPECTROSCOPY-
dc.subject.keywordPlusFORCE MICROSCOPY-
dc.subject.keywordPlusEXCITATION-
dc.subject.keywordPlusFRICTION-
dc.subject.keywordPlusSTATES-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusOXIDE-
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