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Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
Tribological characteristics of probe tip and PZT media for AFM-based recording technology Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02 |
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