Showing results 1 to 11 of 11
An electric field detector using electro-optic device Lee, C; Jeon, Y; Jeong, D; Yune, IJ; No, Kwangsoo, PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , v.4564, no.0, pp.311 - 322, 2001 |
An electric field detector using electro-optic device Lee, C; Jeon, Y; Jeong, D; Yeom, Ik Jun; No, Kwangsoo, Optomechatronic Systems II, pp.311 - 322, SPIE, 2001-10-29 |
Drying temperature effects on the electro-optic coefficients of PZT thin films Lee, C; Spirin, V; Jeon, Y; Kim, D; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.22, no.1-4, pp.959 - 971, 1998 |
Fabrication and characterization of PZT thick films on silicon substrates No, Kwangsoo; Jeon, Y; Chung, J, The 2nd International Symposium on Electronic Materials between Korea and Japan, 1999-01-01 |
Fabrication and characterization of PZT/TiO(x)/SiO(2)/SiN(x)/SiO(2)/Si structure for acousto-optic device applications Lee, C; Lee, C; Liu, JY; Jeon, Y; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.35, no.1-4, pp.1741 - 1752, 2001 |
Fabrication and characterization of PZT/TiOx/SiO2/SiNx/SiO2/Si structure for acousto-optic device applications Lee, C; Lee, C; Liu, J; Jeon, Y; No, Kwangsoo, 12th Interntional Symposium on Integrated Ferroelectrics, v.35, no.40547, 2000-03-12 |
Fabrication of PZT thick films on silicon substrates for piezoelectric actuator Jeon, Y; Chung, JS; No, Kwangsoo, JOURNAL OF ELECTROCERAMICS, v.4, no.1, pp.195 - 199, 2000-03 |
Lithium niobate electro-optic sensor for examining conductive patterns on display panels Lee, C; Jeon, Y; No, Kwangsoo, OPTICAL ENGINEERING, v.42, pp.1589 - 1596, 2003-06 |
Low temperature sintering of screen-printed Pb(ZrTi)O3 thick films Jeon, Y; Seo, YG; Kim, SJ; No, Kwangsoo, 12th International Symposium on Integrated Ferroelectrics, v.30, no.40547, pp.91 - 101, 2000-03-12 |
Microwave Model of Anisotropic Conductive Adhesive Flip-Chip Interconnections for High Frequency Applications Kim, Joungho; Paik, Kyung-Wook; Yim, M; Ryu, W; Jeon, Y, Electronic Components and Technology Conference, Electronic Components and Technology Conference, 1999-05 |
Residual stress analysis of Pt bottom electrodes on ZrO2/SiO2/Si and SiO2/Si substrates for Pb(ZrTi)O-3 thick films Jeon, Y; Kim, DG; No, Kwangsoo; Kim, SJ; Chung, J, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.5A, pp.2705 - 2709, 2000-05 |
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