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Showing results 1 to 9 of 9

1
AFM Assisted Observation of Polarisation Domains in Pt-PZT-Pt EFCAPs During Fatigue Onset

Colla, EL; Taylor, DV; Tagantsev, AK; Hong, SB; No, Kwangsoo; Setter, N, COST ACT, 1998

2
Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O-3 thin film capacitors with Pt electrodes

Colla, EL; Hong, Daniel Seungbum; Taylor, DV; Tagantsev, AK; Setter, N; No, Kwangsoo, APPLIED PHYSICS LETTERS, v.72, no.21, pp.2763 - 2765, 1998-05

3
Domain Swtching시의 domain의 핵생성 및 성장에 관한 연구

노광수; 홍승범; 김은아; Colla, EL; Setter, N, 한국요업학회 춘계학술발표대회, pp.66 - 66, 한국요업학회, 1998-01-01

4
High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O-3 ferroelectric thin film capacitors

Hong, Daniel Seungbum; Colla, EL; Kim, E; Taylor, DV; Tagantsev, AK; Muralt, P; No, Kwangsoo; et al, JOURNAL OF APPLIED PHYSICS, v.86, no.1, pp.607 - 613, 1999-07

5
Microscopic observation of "region by region" polarisation domains freezing during fatigue of the Pt-PZT-Pt system

Colla, EL; Taylor, DV; Hong, Daniel Seungbum; Tagantsev, AK; No, Kwangsoo; Setter, N, INTEGRATED FERROELECTRICS, v.22, no.1-4, pp.757 - 764, 1998

6
Observation of domain nucleation and growth during switching process

Hong, Daniel Seungbum; Colla, EL; Kim, E; No, Kwangsoo; Taylor, DV; Tagantsev, AK; Muralt, P; et al, FERROELECTRICS, v.223, no.1-4, pp.143 - 143, 1999

7
Principle of ferroelectric domain imaging using atomic force microscope

Hong, Daniel Seungbum; Woo, J; Shin, H; Jeon, JU; Pak, YE; Colla, EL; Setter, N; et al, JOURNAL OF APPLIED PHYSICS, v.89, no.2, pp.1377 - 1386, 2001-01

8
Size and top electrode-edge effects on fatigue in Pb(Zr,Ti)O-3 capacitors with Pt-electrodes

Torii, K; Colla, EL; Song, HW; Tagantsev, AK; No, Kwangsoo; Setter, N, INTEGRATED FERROELECTRICS, v.32, no.1-4, pp.907 - 916, 2001

9
Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O-3 by atomic force microscopy

Hong, S; Ecabart, B; Colla, EL; Setter, N, APPLIED PHYSICS LETTERS, v.84, no.13, pp.2382 - 2384, 2004-03

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