| 1 | Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments Yuk, Jong Min; Lee, Jeong-Yong; Lee, Zong-Hoon; No, Y. S.; Kim, T. W.; Kim, J. Y.; Choi, W. K., APPLIED SURFACE SCIENCE, v.257, no.11, pp.4817 - 4820, 2011-03 |
| 2 | Correlation between the atomic structures and the misorientation angles of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substrates Shin, J. W.; Lee, JeongYong; No, Y. S.; Kim, T. W.; Choi, W. K., APPLIED PHYSICS LETTERS, v.89, no.10, 2006-09 |
| 3 | Effect of thermal annealing on the formation of preferential c-axis orientation and an interfacial layer for ZnO thin films grown on an n-Si (001) substrate Yuk, Jong Min; Shin, J. W.; Lee, Jeong-Yong; Son, D. I.; Jung, J. H.; Kim, T. W.; Kim, J. Y.; et al, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, no.3, pp.608 - 611, 2007-03 |
| 4 | Effect of thermal annealing on the microstructural and electrical properties of Al-doped ZnO thin films grown on n-Si (100) substrates Han, J. H.; No, Y. S.; Lee, JeongYong; Kim, T. W.; Kim, J. Y.; Choi, W. K., PHYSICA E-LOW-DIMENSIONAL SYSTEMS NANOSTRUCTURES, v.43, no.1, pp.256 - 260, 2010-11 |
| 5 | Evolution mechanisms of the surface morphology of grains in ZnO thin films grown on p-InP substrates due to thermal annealing Yuk, Jong Min; Lee, Jeong-Yong; No, Y. S.; Kim, T. W.; Choi, W. K., APPLIED PHYSICS LETTERS, v.93, no.2, 2008-07 |
| 6 | Formation mechanism of ZnSiO(3) nanoparticles embedded in an amorphous interfacial layer between a ZnO thin film and an n-Si (001) substrate due to thermal treatment Yuk, Jong Min; Lee, Jeong-Yong; Jung, J. H.; Lee, D. U.; Kim, T. W.; Son, D. I.; Choi, W. K., JOURNAL OF APPLIED PHYSICS, v.103, no.8, 2008-04 |
| 7 | Formation mechanisms of metallic Zn nanodots by using ZnO thin films deposited on n-Si substrates Yuk, Jong Min; Lee, Jeong-Yong; Kim, Y.; No, Y. S.; Kim, T. W.; Choi, W. K., APPLIED PHYSICS LETTERS, v.97, no.6, 2010-08 |
| 8 | Formation mechanisms of ZnO amorphous layers due to thermal treatment of ZnO thin films grown on p-InP (100) substrates Yuk, Jong Min; Lee, Jeong-Yong; No, Y. S.; Kim, T. W.; Choi, W. K., JOURNAL OF APPLIED PHYSICS, v.103, no.8, 2008-04 |
| 9 | Initial formation mechanisms of the supersaturation region and the columnar structure in ZnO thin films grown on n-Si (001) substrates Yuk, Jong Min; Lee, Jeong-Yong; Jung, J. H.; Kim, T. W.; Son, D. I.; Choi, W. K., APPLIED PHYSICS LETTERS, v.90, no.3, pp.233 - 236, 2007-01 |
| 10 | Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates Han, J. H.; No, Y. S.; Kim, T. W.; Lee, JeongYong; Kim, J. Y.; Choi, W. K., APPLIED SURFACE SCIENCE, v.256, no.6, pp.1920 - 1924, 2010-01 |
| 11 | The formation mechanism of periodic Zn nanocrystal arrays embedded in an amorphous layer by rapid electron beam irradiation Shin, Jae Won; Lee, JeongYong; No, Y. S.; kim, T. W.; Choi, W. K.; Jin, S., NANOTECHNOLOGY, v.19, no.29, 2008-07 |
| 12 | Transformation mechanisms from metallic Zn nanocrystals to insulating ZnSiO(3) nanocrystals in a SiO(2) matrix due to thermal treatment Yuk, Jong Min; Lee, Jeong-Yong; No, Y. S.; Kim, T. W.; Choi, W. K., APPLIED PHYSICS LETTERS, v.93, no.22, 2008-12 |
