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Showing results 1 to 6 of 6

1
Drain bias effect on the instability of amorphous indium gallium zinc oxide thin film transistor

Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Seo, Jong-Hyun; Yang, Shinhyuk; Park, Sang-Hee Ko, THIN SOLID FILMS, v.547, no.29, pp.263 - 266, 2013-11

2
Effects of gate bias stress on the electrical characteristics of ZnO thin film transistor

Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Shin, Jae-Heon; Hwang, Chi-Sun; Park, Sang-Hee Ko; Seo, Jong-Hyun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.1, pp.412 - 415, 2008-07

3
Effects of the composition of sputtering target on the stability of InGaZnO thin film transistor

Huh, Jun-Young; Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Seo, Jong-Huyn; Ryu, Min-Ki; Park, Sang-Hee Ko; et al, THIN SOLID FILMS, v.519, no.20, pp.6868 - 6871, 2011-08

4
Light and bias stability of a-IGZO TFT fabricated by r.f. magnetron sputtering

Huh, Jun-Young; Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Seo, Jong-Huyn; et al, CURRENT APPLIED PHYSICS, v.11, no.5, pp.49 - 53, 2011-09

5
Negative Gate Bias and Light Illumination-Induced Hump in Amorphous InGaZnO Thin Film Transistor

Jeon, Jae-Hong; Seo, Seung-Bum; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Kee-Chan; Park, Sang-Hee Ko, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.11, pp.7535 - 7539, 2013-11

6
Stability of a-InGaZnO thin film transistor under pulsed gate bias stress

Seo, Seung-Bum; Jeon, Jae-Hong; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Sang-Hee Ko, THIN SOLID FILMS, v.521, pp.212 - 215, 2012-10

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