Showing results 3 to 3 of 3
Thermal stability dependence on the stacking order and thickness ratio of the CoPt-TiO2/CoCrPt-SiO2 stacked media Park, S. H.; Lee, Taek Dong; Kong, S. H.; Yoon, S. Y.; Lee, H. S.; Kim, H. J.; Oh, H. S., JOURNAL OF APPLIED PHYSICS, v.103, no.7, pp.07F528, 2008-04 |
Discover