Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Title
Showing results 12201 to 12220 of 19283
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory deviceQuantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy 노광수, ISAF, 2000 |
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14 |
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001 |
| Quantitative analysis of the lithium transport through the $Li_{1-δ}CoO_2$ film electrode prepared by RF magnetron sputtering = RF 마그네트론 스퍼터링법으로 제조된 $Li_{1-δ}CoO_2$ 박막 전극을 통한 리튬 이동의 정량적 해석link Go, Joo-Young; 고주영; et al, 한국과학기술원, 2001 |
| Quantitative comparison of the influences of tungsten and molybdenum on the passivity of Fe-29Cr ferritic stainless steels Ahn, MK; Kwon, Hyuk-Sang; Lee, HyuckMo, CORROSION SCIENCE, v.40, no.2-3, pp.307 - 322, 1998-02 |
| Quantitative evaluations of a high-voltage multiscan CCD camera Kim, YM; Lee, JeongYong; Moonen, D; Jang, KI; Kim, YJ, JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224, 2007-12 |
| Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy Choi, Hyun-Woo; Hong, Daniel Seungbum; No, Kwang-Soo, REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.11, 2011-11 |
| Quantitative Measurement of Li-Ion Concentration and Diffusivity in Solid-State Electrolyte Park, Gun; Kim, Hongjun; Oh, Jimin; Choi, Youngwoo; Ovchinnikova, Olga S.; Min, Seokhwan; Lee, Young-Gi; et al, ACS APPLIED ENERGY MATERIALS, v.4, no.1, pp.784 - 790, 2021-01 |
| Quantitative measurements of absolute dielectrophoretic forces using optical tweezers Hong, Yoochan; Pyo, Jin-Woo; Baek, Sang Hyun; Lee, Sang Woo; Yoon, Dae Sung; No, Kwangsoo; Kim, Beop-Min, OPTICS LETTERS, v.35, no.14, pp.2493 - 2495, 2010-07 |
| Quantitative morphometric measurements using site selective image cytometry of intact tissue Kwon, Hyuk-Sang; Nam, YoonSung; Wiktor-Brown, Dominika M.; Engelward, Bevin P.; So, Peter T. C., JOURNAL OF THE ROYAL SOCIETY INTERFACE, v.6, pp.45 - 57, 2009-02 |
| Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
| Quantitative optical analysis for gold nanoparticle array formulated by evaporation induced self-assembly 김리향; 신종화, 한국광학회 2017 하계학술발표대회, 한국광학회, 2017-07-12 |
| Quantitative study on the enhancement of sidewall coverage of sputter-deposited film by partially tapering the sidewall of via holes Kim, Chang-Gyu; Lee, Won-Jong, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.29, no.2, pp.020604-1 - 020604-6, 2011-03 |
| Quantitatuve analysis of ultrathin SiO2 interfacial layer by AES depth profiling Soh, Ju-Won; Kim, Jong-Seok; Lee, Won-Jong, KOREAN JOURNAL OF CERAMICS, v.1, no.1, pp.7 - 12, 1995-03 |
| Quantum dot film having porous structure and manufacturing method for the same Jung, Yeon Sik; Jeon, Duk Young; Kim, Geon Yeong; Choi, Jin Young; Lee, Chul Hee; Lim, Hun Hee |
| Quantum Dot Nanoctystals for Highly Efficient Regeneration of Nicotinamide Cofactor under Visible Light Park, Chan Beum, 2009 Joint Symposium on Materials Science and Engineering for the 21st Century, 2009-09-06 |
| Quantum dot-DNA Hydrogel for Sensitive DNA Assay 남윤성, 2019 춘계한국바이오칩학회, 한국바이오칩학회, 2019-05-15 |
| Quantum Dot/Siloxane Composite Film Exceptionally Stable Against Heat and Moisture Kim, Hwea Yoon; Yoon, Da-Eun; Jang, Junho; Choi, Gwang-Mun; Lee, Doh Chang; Bae, Byeong-Soo, SID Symposium, Seminar, and Exhibition 2017, Display Week 2017, pp.451 - 454, John Wiley and Sons Inc, 2017-05 |
| Quantum Dot/Siloxane Composite Film Exceptionally Stable against Oxidation under Heat and Moisture Kim, Hwea Yoon; Yoon, Daeun; Jang, Junho; Lee, Daewon; Choi, Gwang Mun; Chang, Joon Ha; Lee, Jeong Yong; et al, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.138, no.50, pp.16478 - 16485, 2016-12 |
| Quantum rod Quantum rod film and Quantum rod display device LEE, YONG-HEE; Jeon, Duk Young; KIM, SO-MANG; KIM, KYU-NAM |
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