DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Sang-Kuk | ko |
dc.contributor.author | Lee, Jae Sung | ko |
dc.contributor.author | Kwak, Han | ko |
dc.contributor.author | Kang, Sung-Oong | ko |
dc.contributor.author | Lee, Jongjin | ko |
dc.contributor.author | Yu, In-Suk | ko |
dc.date.accessioned | 2013-08-22T02:29:56Z | - |
dc.date.available | 2013-08-22T02:29:56Z | - |
dc.date.created | 2013-08-21 | - |
dc.date.created | 2013-08-21 | - |
dc.date.created | 2013-08-21 | - |
dc.date.issued | 2013-06 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, v.102, no.24 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10203/175588 | - |
dc.description.abstract | The electrical contact resistance between two stainless steel balls was measured to study the electrical conduction of a metallic contact separated by a thin oxide layer. Through a statistical approach, the contact resistance was found to have a bimodal log-normal distribution. This result reflects conduction by tunneling and electrically induced metal bridge, which was explained by the simulation of a random circuit breaker model, inside the insulating layer. Based on the results of this study, we suggest an effective conduction model to explain macroscopic electrical contact systems with a nano-or microscopic filamentary conduction mechanism. (C) 2013 AIP Publishing LLC. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Statistical properties of the electrically induced contact resistance between two stainless steel balls | - |
dc.type | Article | - |
dc.identifier.wosid | 000320962400020 | - |
dc.identifier.scopusid | 2-s2.0-84879824689 | - |
dc.type.rims | ART | - |
dc.citation.volume | 102 | - |
dc.citation.issue | 24 | - |
dc.citation.publicationname | APPLIED PHYSICS LETTERS | - |
dc.identifier.doi | 10.1063/1.4811354 | - |
dc.contributor.nonIdAuthor | Kim, Sang-Kuk | - |
dc.contributor.nonIdAuthor | Lee, Jae Sung | - |
dc.contributor.nonIdAuthor | Kwak, Han | - |
dc.contributor.nonIdAuthor | Kang, Sung-Oong | - |
dc.contributor.nonIdAuthor | Yu, In-Suk | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | CONDUCTIVE ROUGH SURFACES | - |
dc.subject.keywordPlus | THIN INSULATING FILM | - |
dc.subject.keywordPlus | DIELECTRIC-BREAKDOWN | - |
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