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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

A sampling-based 128x128 direct photon-counting X-ray image sensor with 3 energy bins and spatial resolution of 60μm/pixel

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Kim, Hyun-Sikresearcher / Han, Sang-Wookresearcher / Yang, Jun-Hyeokresearcher / Kim, Sunilresearcher / Kim, Youngresearcher / Kim, Sangwookresearcher / Yoon, Dae-Kunresearcher / Lee, Jun-Suresearcher / Park, Jae-Chulresearcher / Sung, Younghunresearcher / Lee, Seong-Deokresearcher / Ryu, Seung-Takresearcher / Cho, Gyu-Hyeongresearcher
Publisher
IEEE
Issue Date
2012-02-19
Language
English
Citation

2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, pp.110 - 112

ISSN
0193-6530
URI
http://hdl.handle.net/10203/172310
Appears in Collection
EE-Conference Papers(학술회의논문)
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