Realizing Near-True Voltage Scaling in Variation-Sensitive L1 Caches via Fault Buffers

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dc.contributor.authorKim Soontaeko
dc.contributor.authorTayyeb Mahmoodko
dc.date.accessioned2013-03-29T12:05:18Z-
dc.date.available2013-03-29T12:05:18Z-
dc.date.created2012-07-13-
dc.date.created2012-07-13-
dc.date.created2012-07-13-
dc.date.issued2011-10-11-
dc.identifier.citationInternational Conference on Compilers, Architecture and Synthesis for Embedded Systems-
dc.identifier.urihttp://hdl.handle.net/10203/170572-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleRealizing Near-True Voltage Scaling in Variation-Sensitive L1 Caches via Fault Buffers-
dc.typeConference-
dc.identifier.wosid000397432700011-
dc.identifier.scopusid2-s2.0-81255207111-
dc.type.rimsCONF-
dc.citation.publicationnameInternational Conference on Compilers, Architecture and Synthesis for Embedded Systems-
dc.identifier.conferencecountryCH-
dc.identifier.conferencelocationTaipei, Taiwan-
dc.contributor.localauthorKim Soontae-
dc.contributor.nonIdAuthorTayyeb Mahmood-
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CS-Conference Papers(학술회의논문)
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