DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Moonzoo | ko |
dc.contributor.author | Kim, Yunho | ko |
dc.date.accessioned | 2013-03-29T02:58:07Z | - |
dc.date.available | 2013-03-29T02:58:07Z | - |
dc.date.created | 2012-03-22 | - |
dc.date.created | 2012-03-22 | - |
dc.date.created | 2012-03-22 | - |
dc.date.issued | 2011-10-14 | - |
dc.identifier.citation | Automated Technology for Verification and Analysis, pp.51 - 59 | - |
dc.identifier.uri | http://hdl.handle.net/10203/168438 | - |
dc.language | English | - |
dc.publisher | Automated Technology for Verification and Analysis | - |
dc.title | Automated Analysis of Industrial Embedded Software | - |
dc.type | Conference | - |
dc.identifier.wosid | 000306498800005 | - |
dc.identifier.scopusid | 2-s2.0-80054068208 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 51 | - |
dc.citation.endingpage | 59 | - |
dc.citation.publicationname | Automated Technology for Verification and Analysis | - |
dc.identifier.conferencecountry | TH | - |
dc.contributor.localauthor | Kim, Moonzoo | - |
dc.contributor.nonIdAuthor | Kim, Yunho | - |
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