Determining whether a thin film grown at room temperature can have a dielectric constant that is higher than that of its bulk material
- Publisher
- ECS
- Issue Date
- 2010-10-10
- Language
- ENG
- Citation
218th ECS Meeting, pp.1538 -
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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