DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jung H.-J. | - |
dc.contributor.author | Ahn J.-K. | - |
dc.contributor.author | Kim C.-S. | - |
dc.contributor.author | Lee, JeongYong | - |
dc.contributor.author | Park S.-S. | - |
dc.contributor.author | Yoon S.-G. | - |
dc.date.accessioned | 2013-03-28T10:41:44Z | - |
dc.date.available | 2013-03-28T10:41:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2010-10-10 | - |
dc.identifier.citation | 218th ECS Meeting, v., no., pp.1538 - | - |
dc.identifier.uri | http://hdl.handle.net/10203/164963 | - |
dc.language | ENG | - |
dc.publisher | ECS | - |
dc.title | Determining whether a thin film grown at room temperature can have a dielectric constant that is higher than that of its bulk material | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-79955444945 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1538 | - |
dc.citation.publicationname | 218th ECS Meeting | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, JeongYong | - |
dc.contributor.nonIdAuthor | Jung H.-J. | - |
dc.contributor.nonIdAuthor | Ahn J.-K. | - |
dc.contributor.nonIdAuthor | Kim C.-S. | - |
dc.contributor.nonIdAuthor | Park S.-S. | - |
dc.contributor.nonIdAuthor | Yoon S.-G. | - |
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