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A framework for the V&V capability assessment focused on the safety-criticality

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Yoon, Kyung-A / Park, Seunghun / Bae, Doo-Hwanresearcher / Chang, Hoon-Seon / Jung, Jae-Cheon
Publisher
IEEE
Issue Date
2005-09-24
Language
English
Citation

13th IEEE International Workshop on Software Technology and Engineering Practice 2005, pp.17 - 24

URI
http://hdl.handle.net/10203/15688
Appears in Collection
CS-Conference Papers(학술회의논문)
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