Development of junction temperature decision (JTD) map for thermal design of nano-scale devices considering leakage power
- Issue Date
- 2007-03-18
- Language
- ENG
- Citation
23rd Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM, pp.63 - 67
- ISSN
- 1065-2221
- Appears in Collection
- RIMS Conference Papers
- Files in This Item
- There are no files associated with this item.
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