Development of junction temperature decision (JTD) map for thermal design of nano-scale devices considering leakage power
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yunhyeok I. | - |
| dc.contributor.author | Eun S.C. | - |
| dc.contributor.author | Kiwon C. | - |
| dc.contributor.author | Sayoon K. | - |
| dc.date.accessioned | 2013-03-26T01:37:43Z | - |
| dc.date.available | 2013-03-26T01:37:43Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-03-18 | - |
| dc.identifier.citation | 23rd Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM, v., no., pp.63 - 67 | - |
| dc.identifier.issn | 1065-2221 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/156828 | - |
| dc.language | ENG | - |
| dc.title | Development of junction temperature decision (JTD) map for thermal design of nano-scale devices considering leakage power | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-34548107002 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 63 | - |
| dc.citation.endingpage | 67 | - |
| dc.citation.publicationname | 23rd Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Yunhyeok I. | - |
| dc.contributor.nonIdAuthor | Eun S.C. | - |
| dc.contributor.nonIdAuthor | Kiwon C. | - |
| dc.contributor.nonIdAuthor | Sayoon K. | - |
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