NEMS switch with 30 nm thick beam and 20 nm high air gap for high density non-volatile memory applications

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Issue Date
2007-12-12
Language
ENG
Citation

2007 International Semiconductor Device Research Symposium, ISDRS

URI
http://hdl.handle.net/10203/155610
Appears in Collection
EE-Conference Papers(학술회의논문)
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