Energetics of Various Electrically Deactivating Defects in Heavily n-type Si(AIP Conference Proceedings, 2005)

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Issue Date
2004-07
Language
ENG
Citation

27th International Conference on the Physics of Semiconductors, pp.95 - 96

URI
http://hdl.handle.net/10203/150988
Appears in Collection
PH-Conference Papers(학술회의논문)
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