Energetics of Various Electrically Deactivating Defects in Heavily n-type Si(AIP Conference Proceedings, 2005)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chang, Kee-Joo | - |
| dc.contributor.author | Moon, C.-Y. | - |
| dc.contributor.author | Kim, Y.-S. | - |
| dc.contributor.author | Lee, E.-C. | - |
| dc.date.accessioned | 2013-03-18T18:01:26Z | - |
| dc.date.available | 2013-03-18T18:01:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-07 | - |
| dc.identifier.citation | 27th International Conference on the Physics of Semiconductors, v., no., pp.95 - 96 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/150988 | - |
| dc.language | ENG | - |
| dc.title | Energetics of Various Electrically Deactivating Defects in Heavily n-type Si(AIP Conference Proceedings, 2005) | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 95 | - |
| dc.citation.endingpage | 96 | - |
| dc.citation.publicationname | 27th International Conference on the Physics of Semiconductors | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Chang, Kee-Joo | - |
| dc.contributor.nonIdAuthor | Moon, C.-Y. | - |
| dc.contributor.nonIdAuthor | Kim, Y.-S. | - |
| dc.contributor.nonIdAuthor | Lee, E.-C. | - |
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