Showing results 1401 to 1420 of 6044
CIM 관련 국내 표준화 환경에 대한 조사 연구 이호길; 강인필; 서효원; 정경렬; 김홍석; 김용성; 박홍성; et al, 산업공학(IE INTERFACES), v.8, no.3, pp.111 - 121, 1995-09 |
Circular Context-Based Semantic Matching to Identify Web Service Composition, Context enabled Source and Service Selection Segev, Aviv, Integration and Adaption (CSSSIA) workshop in World Wide Web Conference, ., 2008-04-22 |
Citation-Based Author Contribution Measure for Byline-Independency Jung, Sukhwan; Yoon, Wan-Chul, IEEE International Conference on Big Data, Big Data 2019, pp.6086 - 6088, Institute of Electrical and Electronics Engineers Inc., 2019-12 |
CLASS-BASED STORAGE ASSIGNMENT POLICY IN CAROUSEL SYSTEM HA, JW; Hwang, Hark, COMPUTERS INDUSTRIAL ENGINEERING, v.26, no.3, pp.489 - 499, 1994-07 |
Classification algorithms via integer optimization = 정수최적화를 이용한 분류 해법link Kang, Ja-Young; 강자영; et al, 한국과학기술원, 2010 |
Classification and out-of-distribution detection for wafer bin maps = 웨이퍼 결함 패턴 분류 및 분포 외 패턴 탐지link Choi, Jeongman; Kim, Heeyoung; et al, 한국과학기술원, 2023 |
Classification and variable selection algorithms using signomial function = Signomial 함수를 이용한 분류와 변수 선택 해법link Hwang, Kyoung-Mi; 황경미; et al, 한국과학기술원, 2013 |
Classification of Heart Sound Recordings Using Convolution Neural Network Ryu, Heechang; Shin, Hayong; Park, Jinkyoo, Computing in Cardiology, The Canadian Cardiovascular Congress, 2016-09-12 |
Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08 |
Classification of mixed-type defects patterns in wafer bin maps using convolutional neural networks = Convolutional neural networks를 이용한 반도체 웨이퍼빈맵의 혼합된 형태의 결함 패턴 분류link Kyeong, Kiryong; Kim, Heeyoung; et al, 한국과학기술원, 2018 |
Classification trees based on proportional-reduction-in-impurity measure = 비례감소불순도측도를 이용한 나무구조형 정보분류link Ahn, Sung-Jin; 안성진; et al, 한국과학기술원, 1994 |
Classification Using the Patterns Generated from the Logical Analysis of Data Yum, Bong-Jin; Han, J; Kim, N; Jeong, MK, APIEMS 2009, pp.1562 - 1569, 2009 |
Classroom Note: Number of Services in an M/M/2 Busy Period Chae, Kyung-Chul, INTERNATIONAL JOURNAL OF MATHEMATICAL EDUCATION IN SCIENCE AND TECHNOLOGY, v.23, no.4, pp.786 - 789, 1992-07 |
Classroom Note: On the Expected Number of Tosses Until HTHT Appears Chae, Kyung-Chul, INTERNATIONAL JOURNAL OF MATHEMATICAL EDUCATION IN SCIENCE AND TECHNOLOGY, v.24, no.1, pp.158 - 161, 1993-01 |
Classroom Note: Two Instructive Identities Arising from the Matching Distribution Chae, Kyung-Chul, INTERNATIONAL JOURNAL OF MATHEMATICAL EDUCATION IN SCIENCE AND TECHNOLOGY, v.23, no.4, pp.632 - 635, 1992-07 |
Cleaning Plan Optimization for Dual-Armed Cluster Tools With General Chamber Cleaning Periods Lee, Tae-Gyung; Yu, Tae-Sun; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.20, no.3, pp.1890 - 1906, 2023-07 |
Click-aware purchase prediction with push at the top Park, Chanyoung; Kim, Donghyun; Yang, Min-Chul; Lee, Jung-Tae; Yu, Hwanjo, INFORMATION SCIENCES, v.521, pp.350 - 364, 2020-06 |
Closed form solutions for the equilibrium probability distribution in the closed Lu-Kumar network under two buffer priority policies Jung, Seunghwan; Morrison James R, 8th IEEE International Conference on Control and Automation, pp.1488 - 1495, IEEE, 2010-06 |
Closed reentrant queueing networks under affine index policies: Throughput bounds, examples and asymptotic loss Morrison, James R; Juen, Joshua P., Proceedings of the International Federation of Automatic Control World Congress, 2008 |
Closed-Form Expressions on Lot Completion Time for Dual-Armed Cluster Tools With Parallel Processing Modules Kim, Hyunjung; Lee, Jun-Ho, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.16, no.2, pp.898 - 907, 2019-04 |
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