Characterization of (Bi, Ce, La)4Ti3O12 thin film ofr FRAM capacitor prepared by combinatorial liquid source misted chemical deposition (LSMCD) process

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dc.contributor.authorWoo, Seong-Ihl-
dc.contributor.authorKim, KW-
dc.contributor.authorJeon, MK-
dc.contributor.authorOh, KS-
dc.contributor.authorKim, TS-
dc.contributor.authorPark, YK-
dc.contributor.authorChoi, WC-
dc.date.accessioned2013-03-17T04:01:04Z-
dc.date.available2013-03-17T04:01:04Z-
dc.date.created2012-02-06-
dc.date.issued2004-01-
dc.identifier.citation2nd combinatorial & high throughput materials science in gordon conference, v., no., pp.25 - 30-
dc.identifier.urihttp://hdl.handle.net/10203/139619-
dc.languageENG-
dc.titleCharacterization of (Bi, Ce, La)4Ti3O12 thin film ofr FRAM capacitor prepared by combinatorial liquid source misted chemical deposition (LSMCD) process-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage25-
dc.citation.endingpage30-
dc.citation.publicationname2nd combinatorial & high throughput materials science in gordon conference-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorWoo, Seong-Ihl-
dc.contributor.nonIdAuthorKim, KW-
dc.contributor.nonIdAuthorJeon, MK-
dc.contributor.nonIdAuthorOh, KS-
dc.contributor.nonIdAuthorKim, TS-
dc.contributor.nonIdAuthorPark, YK-
dc.contributor.nonIdAuthorChoi, WC-
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CBE-Conference Papers(학술회의논문)
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