ECRCVD에 의해 증착한 SiOF 저유전율 박막의 고유응력 발생원인

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 359
  • Download : 0
DC FieldValueLanguage
dc.contributor.author최시경-
dc.contributor.authorKim, SP-
dc.date.accessioned2013-03-17T01:23:22Z-
dc.date.available2013-03-17T01:23:22Z-
dc.date.created2012-02-06-
dc.date.issued1999-
dc.identifier.citation추계 한국요업학회, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/138302-
dc.languageKOR-
dc.titleECRCVD에 의해 증착한 SiOF 저유전율 박막의 고유응력 발생원인-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname추계 한국요업학회-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor최시경-
dc.contributor.nonIdAuthorKim, SP-
Appears in Collection
MS-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0