ECRPECVD법으로 증착한 SiOF박막의 잔류응력 안정화에 관한 연구A study on the stabilization of residual stress in SiOF thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition

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Issue Date
2000
Language
KOR
Citation

한국요업학회, pp.192 -

URI
http://hdl.handle.net/10203/136366
Appears in Collection
MS-Conference Papers(학술회의논문)
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