ECRPECVD법으로 증착한 SiOF박막의 잔류응력 안정화에 관한 연구A study on the stabilization of residual stress in SiOF thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition

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dc.contributor.author최시경-
dc.contributor.author김석필-
dc.contributor.author박영수-
dc.contributor.author정일섭-
dc.date.accessioned2013-03-16T22:03:37Z-
dc.date.available2013-03-16T22:03:37Z-
dc.date.created2012-02-06-
dc.date.issued2000-
dc.identifier.citation한국요업학회, v., no., pp.192 --
dc.identifier.urihttp://hdl.handle.net/10203/136366-
dc.languageKOR-
dc.titleECRPECVD법으로 증착한 SiOF박막의 잔류응력 안정화에 관한 연구A study on the stabilization of residual stress in SiOF thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage192-
dc.citation.publicationname한국요업학회-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor최시경-
dc.contributor.nonIdAuthor김석필-
dc.contributor.nonIdAuthor박영수-
dc.contributor.nonIdAuthor정일섭-
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MS-Conference Papers(학술회의논문)
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