A Novel Procedure for Circuit Modeling of Dielectric Relaxation of (Ba,Sr)TiO3 Thin Film Capacitor and Its Effect on DRAM Operation
- Issue Date
- 1999
- Language
- KOR
- Citation
제6회 한국반도체 학술대회, pp.239 - 240
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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