Intermittency of Barkhausen avalanche in Co nanothin films

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We investigate the statistical distribution of separation time DeltaT between the adjacent two Barkhausen jumps in Co films having the thickness ranging from 5 to 50 nm. By means of a magneto-optical microscope magnetometer, we determine the time-dependent magnetization curve and the separation time DeltaT between two jump events during avalanche process from the directly observed time-resolved domain evolution patterns. Through a statistical analysis of DeltaT, we find that the distribution P(DeltaT) seems to follow a power-law behavior with the same form within the error range, irrespective of the film thickness. (C) 2004 American Institute of Physics.
Publisher
AMER INST PHYSICS
Issue Date
2004-06
Language
English
Article Type
Article; Proceedings Paper
Keywords

SELF-ORGANIZED CRITICALITY; MAGNETOOPTICAL MICROSCOPE MAGNETOMETER; MAGNETIC-DOMAIN PATTERNS; NOISE

Citation

JOURNAL OF APPLIED PHYSICS, v.95, pp.6971 - 6973

ISSN
0021-8979
URI
http://hdl.handle.net/10203/13395
Appears in Collection
RIMS Journal Papers
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