DSpace at KOASAS: High frequency measurement and characterization of ACF flip chip interconnects

DSpace at KOASAS

College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

High frequency measurement and characterization of ACF flip chip interconnects

Cited 0 time in webofscience

Cited 0 time in scopus

Hit : 334
Download : 0

Export

권운성 / 임명진 / 백경욱 researcher

Publisher: 한국마이크로전자 및 패키징학회

Issue Date: 2001-11

Language: KOR

Citation: 한국마이크로전자 및 패키징학회 2001년도 추계 기술심포지움, pp.146 - 150

URI: http://hdl.handle.net/10203/131963

Appears in Collection: MS-Conference Papers(학술회의논문)

Files in This Item: There are no files associated with this item.

Display Full Item Record

qr_code

트윗하기

KOASAS

Knowledge Service Development Team, KAIST 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea. T. 82-42-350-4493 Email. koasas@kaist.ac.kr
Copyright © 2016. Korea Advanced Institute of Science and Technology. All Rights Reserved.

KOASAS

KOASAS

Browse

High frequency measurement and characterization of ACF flip chip interconnects

KOASAS

Communities & Collections