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Automatic Test Case Generation Using Multi-protocol Test Method

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dc.contributor.authorLee, Soo-In-
dc.contributor.authorPark, Yongbum-
dc.contributor.authorYoun, Hee Yong-
dc.contributor.authorKim, Myungchul-
dc.contributor.authorLee, Ben-
dc.date.accessioned2013-03-16T11:38:35Z-
dc.date.available2013-03-16T11:38:35Z-
dc.date.created2012-02-06-
dc.date.issued2000-
dc.identifier.citationIEEE Ninth International Conference on Computer Communications and Networks, v., no., pp.360 - 366-
dc.identifier.urihttp://hdl.handle.net/10203/130907-
dc.languageENG-
dc.publisherIEEE-
dc.titleAutomatic Test Case Generation Using Multi-protocol Test Method-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage360-
dc.citation.endingpage366-
dc.citation.publicationnameIEEE Ninth International Conference on Computer Communications and Networks-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, Myungchul-
dc.contributor.nonIdAuthorLee, Soo-In-
dc.contributor.nonIdAuthorPark, Yongbum-
dc.contributor.nonIdAuthorYoun, Hee Yong-
dc.contributor.nonIdAuthorLee, Ben-
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CS-Conference Papers(학술회의논문)
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