DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn, WS | ko |
dc.contributor.author | Ahn, SH | ko |
dc.contributor.author | Choi, Si-Kyung | ko |
dc.date.accessioned | 2009-11-13T07:17:39Z | - |
dc.date.available | 2009-11-13T07:17:39Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-12 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v.100, no.11, pp.443 - 448 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10203/12581 | - |
dc.description.abstract | We observed the retention loss of dot domains (36 nm diameter) and square domains with sizes of 1 and 25 mu m(2) that were reversed by applying an electric field at an atomic force microscopy (AFM) conductive tip on a heteroepitaxial PbTiO3 thin film with + polarization in the virgin state, which was fabricated via hydrothermal epitaxy below T-c. Through theoretical calculations, it was discussed that the retention loss phenomena of a domain reversed by using an AFM tip were derived from the summation of the depolarization field energy and the strain-polarization coupling energy. Since the retention loss of the reversed domain with a straight c/c domain wall by applying a homogeneous electric field did not occur, we suggest that a cylindrical domain, which has a nearly straight c/c domain wall that extends to the bottom electrode on the given thin film, would be free from the retention loss. (c) 2006 American Institute of Physics. | - |
dc.description.sponsorship | This work was supported by the Ministry of Science and Technology (M1010500066-01H2006400), the National Research Laboratory Program (M10400000024-04J0000-02410), and the Brain Korea 21 project of 2005. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | SCANNING FORCE MICROSCOPY | - |
dc.subject | THIN-FILMS | - |
dc.subject | CURIE-TEMPERATURE | - |
dc.subject | PBTIO3 | - |
dc.subject | DOMAINS | - |
dc.subject | SIZE | - |
dc.subject | POLARIZATION | - |
dc.title | Retention loss behaviors in heteroepitaxial ferroelectric film with a+c monodomain fabricated by hydrothermal epitaxy below T-c | - |
dc.type | Article | - |
dc.identifier.wosid | 000242887400131 | - |
dc.identifier.scopusid | 2-s2.0-33845767500 | - |
dc.type.rims | ART | - |
dc.citation.volume | 100 | - |
dc.citation.issue | 11 | - |
dc.citation.beginningpage | 443 | - |
dc.citation.endingpage | 448 | - |
dc.citation.publicationname | JOURNAL OF APPLIED PHYSICS | - |
dc.identifier.doi | 10.1063/1.2369664 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Choi, Si-Kyung | - |
dc.contributor.nonIdAuthor | Ahn, WS | - |
dc.contributor.nonIdAuthor | Ahn, SH | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | SCANNING FORCE MICROSCOPY | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | CURIE-TEMPERATURE | - |
dc.subject.keywordPlus | PBTIO3 | - |
dc.subject.keywordPlus | DOMAINS | - |
dc.subject.keywordPlus | SIZE | - |
dc.subject.keywordPlus | POLARIZATION | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.