DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn, WS | ko |
dc.contributor.author | Jung, WW | ko |
dc.contributor.author | Choi, Si-Kyung | ko |
dc.contributor.author | Cho, Y | ko |
dc.date.accessioned | 2009-11-13T06:47:55Z | - |
dc.date.available | 2009-11-13T06:47:55Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-02 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, v.88, no.8, pp.869 - 875 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10203/12577 | - |
dc.description.abstract | We observed the retention loss phenomena of the nanodomains with an average diameter of 36 nm and that of the square domains with a size of 1 and 25 mu m(2) that were reversed by an applying electric field at an atomic force microscopy conductive tip in a heteroepitaxial PbTiO3 thin film, which was fabricated via hydrothermal epitaxy below Curie temperature, T-C. While the nanodomains did not undergo significant retention loss until 5.3x10(6) s, the square domains revealed some retention loss for a fixed period after long latent periods. The observed phenomena were explained in terms of the instability of the curved c/c domain wall and the compressive strain energy. Analyses showed that the nanodomains composed a cylinder extending to the bottom electrode; however, the square domains had a curved c/c domain wall, including the compressive strain energy, and these factors caused the retention loss. (c) 2006 American Institute of Physics. | - |
dc.description.sponsorship | This work was supported by the Korean Ministry of Science and Technology (M1010500066-01H2006400), the National Research Laboratory Program (M10400000024-04J0000-02410), and the Brain Korea 21 project of 2005. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | FERROELECTRIC THIN-FILMS | - |
dc.subject | FORCE MICROSCOPY | - |
dc.subject | DOMAINS | - |
dc.subject | POLARIZATION | - |
dc.subject | INSTABILITY | - |
dc.title | Retention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy | - |
dc.type | Article | - |
dc.identifier.wosid | 000235553300053 | - |
dc.identifier.scopusid | 2-s2.0-33644508640 | - |
dc.type.rims | ART | - |
dc.citation.volume | 88 | - |
dc.citation.issue | 8 | - |
dc.citation.beginningpage | 869 | - |
dc.citation.endingpage | 875 | - |
dc.citation.publicationname | APPLIED PHYSICS LETTERS | - |
dc.identifier.doi | 10.1063/1.2178417 | - |
dc.contributor.localauthor | Choi, Si-Kyung | - |
dc.contributor.nonIdAuthor | Ahn, WS | - |
dc.contributor.nonIdAuthor | Jung, WW | - |
dc.contributor.nonIdAuthor | Cho, Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | FERROELECTRIC THIN-FILMS | - |
dc.subject.keywordPlus | FORCE MICROSCOPY | - |
dc.subject.keywordPlus | DOMAINS | - |
dc.subject.keywordPlus | POLARIZATION | - |
dc.subject.keywordPlus | INSTABILITY | - |
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