Retention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy

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dc.contributor.authorAhn, WSko
dc.contributor.authorJung, WWko
dc.contributor.authorChoi, Si-Kyungko
dc.contributor.authorCho, Yko
dc.date.accessioned2009-11-13T06:47:55Z-
dc.date.available2009-11-13T06:47:55Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-02-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.88, no.8, pp.869 - 875-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/12577-
dc.description.abstractWe observed the retention loss phenomena of the nanodomains with an average diameter of 36 nm and that of the square domains with a size of 1 and 25 mu m(2) that were reversed by an applying electric field at an atomic force microscopy conductive tip in a heteroepitaxial PbTiO3 thin film, which was fabricated via hydrothermal epitaxy below Curie temperature, T-C. While the nanodomains did not undergo significant retention loss until 5.3x10(6) s, the square domains revealed some retention loss for a fixed period after long latent periods. The observed phenomena were explained in terms of the instability of the curved c/c domain wall and the compressive strain energy. Analyses showed that the nanodomains composed a cylinder extending to the bottom electrode; however, the square domains had a curved c/c domain wall, including the compressive strain energy, and these factors caused the retention loss. (c) 2006 American Institute of Physics.-
dc.description.sponsorshipThis work was supported by the Korean Ministry of Science and Technology (M1010500066-01H2006400), the National Research Laboratory Program (M10400000024-04J0000-02410), and the Brain Korea 21 project of 2005.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherAMER INST PHYSICS-
dc.subjectFERROELECTRIC THIN-FILMS-
dc.subjectFORCE MICROSCOPY-
dc.subjectDOMAINS-
dc.subjectPOLARIZATION-
dc.subjectINSTABILITY-
dc.titleRetention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy-
dc.typeArticle-
dc.identifier.wosid000235553300053-
dc.identifier.scopusid2-s2.0-33644508640-
dc.type.rimsART-
dc.citation.volume88-
dc.citation.issue8-
dc.citation.beginningpage869-
dc.citation.endingpage875-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.identifier.doi10.1063/1.2178417-
dc.contributor.localauthorChoi, Si-Kyung-
dc.contributor.nonIdAuthorAhn, WS-
dc.contributor.nonIdAuthorJung, WW-
dc.contributor.nonIdAuthorCho, Y-
dc.type.journalArticleArticle-
dc.subject.keywordPlusFERROELECTRIC THIN-FILMS-
dc.subject.keywordPlusFORCE MICROSCOPY-
dc.subject.keywordPlusDOMAINS-
dc.subject.keywordPlusPOLARIZATION-
dc.subject.keywordPlusINSTABILITY-
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