Effects of microstructure on the creep properties of the lead-free Sn-3.5Ag-Cu solders

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Issue Date
2002-05-28
Language
ENG
Citation

52nd Electronic Components and Technology Conference, 2002, pp.1221 - 1225

ISSN
0569-5503
URI
http://hdl.handle.net/10203/125364
Appears in Collection
MS-Conference Papers(학술회의논문)
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