New probing system for the in-circuit test of a PCB

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Issue Date
1996-04-22
Language
ENG
Citation

Proceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4), v.1, pp.590 - 595

ISSN
1050-4729
URI
http://hdl.handle.net/10203/116810
Appears in Collection
ME-Conference Papers(학술회의논문)
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