New probing system for the in-circuit test of a PCB

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dc.contributor.authorShim J.H.-
dc.contributor.authorCho, Hyungsuck-
dc.contributor.authorKim S.-
dc.date.accessioned2013-03-15T05:54:08Z-
dc.date.available2013-03-15T05:54:08Z-
dc.date.created2012-02-06-
dc.date.issued1996-04-22-
dc.identifier.citationProceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4), v.1, no., pp.590 - 595-
dc.identifier.issn1050-4729-
dc.identifier.urihttp://hdl.handle.net/10203/116810-
dc.languageENG-
dc.titleNew probing system for the in-circuit test of a PCB-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0029695015-
dc.type.rimsCONF-
dc.citation.volume1-
dc.citation.beginningpage590-
dc.citation.endingpage595-
dc.citation.publicationnameProceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4)-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorCho, Hyungsuck-
dc.contributor.nonIdAuthorShim J.H.-
dc.contributor.nonIdAuthorKim S.-
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ME-Conference Papers(학술회의논문)
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