New probing system for the in-circuit test of a PCB
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shim J.H. | - |
| dc.contributor.author | Cho, Hyungsuck | - |
| dc.contributor.author | Kim S. | - |
| dc.date.accessioned | 2013-03-15T05:54:08Z | - |
| dc.date.available | 2013-03-15T05:54:08Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1996-04-22 | - |
| dc.identifier.citation | Proceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4), v.1, no., pp.590 - 595 | - |
| dc.identifier.issn | 1050-4729 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/116810 | - |
| dc.language | ENG | - |
| dc.title | New probing system for the in-circuit test of a PCB | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0029695015 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 1 | - |
| dc.citation.beginningpage | 590 | - |
| dc.citation.endingpage | 595 | - |
| dc.citation.publicationname | Proceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Cho, Hyungsuck | - |
| dc.contributor.nonIdAuthor | Shim J.H. | - |
| dc.contributor.nonIdAuthor | Kim S. | - |
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