Modeling of Small Size Effect for MOSFET's Considering the Gradual Doping Profile in the Source/drain Region

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Issue Date
1988
Language
ENG
Citation

Proc. of 19th Annul Conf. on Modeling and Simulation, pp.1905 -

URI
http://hdl.handle.net/10203/113581
Appears in Collection
MS-Conference Papers(학술회의논문)
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