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Showing results 7 to 12 of 12

7
Migration Pathways and Barrier for B diffusion in SiO2 and SiGe/SiO2 interfaces

Chang, Kee-Joo; Oh, Young-Jun; Lee, Chang Hwi, The 17th International Symposium Physics of semiconductors and Applications, ISPSA, 2014-12-10

8
Migration Pathways and Barriers for B diffusion at Si/SiO2 and SiGe/SiO2 Interface

Kim, Geun Myeong; Oh, Young-Jun; 이창휘; Chang, Kee-Joo, 32nd International Conference on the Physics of Semiconductors, ICPS, 2014-08

9
Role of Oxygen-Related Defects in the Instability of Amorphous In-Ga-Zn-O Thin FlimTransistor

Oh, Young-Jun; HAN, WOOHYUN; Noh, Hyeon-Kyun; Chang, Kee-Joo, 32nd International Conference on the Physics of Semiconductors, ICPS, 2014-08

10
The effects of C and F impurities on the Schottky barrier height and effective work function at TiN/HfO2 interface

Kim, Geun Myeong; Oh, Young-Jun; Chang, Kee-Joo, The 17th Asian Workshop on First-Principles Electronic Structure Calculations, KIAS, 2014-11-05

11
The electronic properties of oxygen interstitial defects in amorphous In-Ga-Zn-O semiconductors

HAN, WOOHYUN; Oh, Young-Jun; Chang, Kee-Joo, The 17th International Symposium Physics of semiconductors and Applications, ISPSA, 2014-12-08

12
The electronic properties of oxygen interstitial defects in amorphous In-Ga-Zn-O semiconductors

HAN, WOOHYUN; Oh, Young-Jun; Chang, Kee-Joo, The 17th Asian Workshop on First-Principles Electronic Structure Calculations, KIAS, 2014-11-05

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