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A Mask Reuse Methodology for Reducing System-on-a-Chip Cost

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Bhattacharya, S / Darringer, J / Ostapko, D / Shin, Youngsooresearcher
Publisher
IEEE
Issue Date
2005-03
Language
English
Citation

Sixth International Symposium on Quality Electronic Design, pp.482 - 487

URI
http://hdl.handle.net/10203/1053
Appears in Collection
EE-Conference Papers(학술회의논문)
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