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Nonparametric Inferences for Ramp Stress Tests under Random Censoring Bai, Do Sun; y. r. chun, RELIABILITY ENGINEERING AND SYSTEM SAFETY, v.41, no.3, pp.217 - 223, 1993 |
Optimum Simple Ramp-Tests for the Weibull Distribution and Type I Censoring Bai, Do Sun; m.s. cha; s.w. chung, IEEE TRANSACTIONS ON RELIABILITY, v.41, no.3, pp.407 - 413, 1992 |
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