Nonparametric Inferences for Ramp Stress Tests under Random Censoring

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This paper considers nonparametric estimation of lifetime distribution of a product under ramp stress accelerated life tests in which the stress on an item increases linearly with time and observations are randomly censored. Assuming that a cumulative exposure model holds, the lifetime distribution of an item under ramp stress is derived. Three nonparametric estimators of the lifetime distribution at use condition stress are obtained for the situation where the time transformation function relating stress to lifetime distributions of a test item is a version of the inverse power law. The proposed estimators are robust to underlying lifetime distribution and are computed in closed form. They are compared with maximum likelihood estimator for small samples under exponential lifetime distribution. The method is extended to the case of competing risks.
Publisher
Elsevier BV
Issue Date
1993
Language
English
Article Type
Article
Keywords

ACCELERATED LIFE TESTS; PROGRESSIVE STRESS; DISTRIBUTIONS; STEP; HYPOTHESES; VOLTAGE

Citation

RELIABILITY ENGINEERING AND SYSTEM SAFETY, v.41, no.3, pp.217 - 223

ISSN
0951-8320
DOI
10.1016/0951-8320(93)90072-7
URI
http://hdl.handle.net/10203/55921
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